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Compact material analyzer

Abstract:

Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.

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US20220244101

united states
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inventor: 
Yasser M. Sabry, Bassem A. Mortada, Khaled Hassan, Abdelrahman Ahmed Maher, Mohamed Elsayed Salem, Diaa Khalil, Mohamed H. Al Haron, Mohammed Ahmed Elsheikh, Ahmed Shebl, Bassam Saadany, Mostafa Medhat, Botros George Iskander Shenouda
current assignee: 
SI Ware Systems Inc
Status: 
Allowed
Status Date: 
December 12, 2023
domain: 
SI Ware Systems Inc
worldwide applications: 
2015 . us us . 2026 . kr au ca wo es ep cn mx jp . 2017 . us us 2018 . il

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