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Self-Referenced Spectrometer

Abstract:

Aspects of the present disclosure relate to a self-referencing spectrometer for providing simultaneous measurement of background or reference spectral density and sample or other spectral density. The self-referencing spectrometer includes an interferometer optically coupled to receive an input beam and to direct the input beam along a first optical path to produce a first interference beam and to direct the input beam along a second optical path to produce a second interference beam, wherein each interference beam is produced prior to an output of the interferometer. The spectrometer also includes a detector optically coupled to simultaneously detect a first interference signal generated from the first interference beam and a second interference signal generated from the second interference beam, and a processor configured to process the first interference signal and the second interference signal and to use the second interference signal as a reference signal when processing the first interference signal.

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CN111936831A

united states
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inventor: 
M·梅德哈特B·莫塔达Y·M·萨布里M·胡萨姆M·安瓦尔A·什布尔H·哈德达拉B·A·萨达尼
current assignee: 
SI Ware Systems Inc
Status: 
Granted
Status Date: 
November 10, 2023
domain: 
SI Ware Systems Inc
worldwide applications: 
2015 . us us . 2026 . kr au ca wo es ep cn mx jp . 2017 . us us 2018 . il

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