Integrated optical probe card and system for batch testing of optical MEMS structures with in-plane optical axis using micro-optical bench components
Abstract:
Images
JP2020513687A
united states
download pdf
inventor:
サダニイ,バサムメダット,モスタファナギイ,ムハメッドシェブル,アハメドサブリィ,ヤセル,エム.モルタダ,バセムカーリル,ディアー
current assignee:
SI-WARE SYSTEMS
Status:
Granted
Status Date:
November 24, 2022
domain:
SI-WARE SYSTEMS
worldwide applications:
2015 . us us . 2026 . kr au ca wo es ep cn mx jp . 2017 . us us 2018 . il
Ready to Streamline analysis processes for your business ?
See NeoSpectra in action and learn how it can enhance your analysis workflows. Complete the form to request a demo and we’ll be glad to guide you through its unique features.
Contact us