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Integrated optical probe card and system for batch testing of optical MEMS structures with in-plane optical axis using micro-optical bench components

Abstract:

Images

JP2020513687A

united states
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inventor: 
サダニイ,バサムメダット,モスタファナギイ,ムハメッドシェブル,アハメドサブリィ,ヤセル,エム.モルタダ,バセムカーリル,ディアー
current assignee: 
SI-WARE SYSTEMS
Status: 
Granted
Status Date: 
November 24, 2022
domain: 
SI-WARE SYSTEMS
worldwide applications: 
2015 . us us . 2026 . kr au ca wo es ep cn mx jp . 2017 . us us 2018 . il

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